ICP-OES / ICP-MS / XRF
Chemical Analysis -- ICP & XRF Spectroscopy
Inductively coupled plasma (ICP) and X-ray fluorescence (XRF) are the workhorses of trace-element and bulk elemental analysis. ICP-OES and ICP-MS achieve parts-per-trillion detection limits for dissolved metals; XRF provides rapid, non-destructive elemental screening of solid samples. Together they cover regulatory requirements in RoHS, REACH, food safety, and environmental monitoring.
What it measures
- Trace metals and heavy elements (Pb, Cd, Hg, As, Cr, Ni…)
- Major and minor elemental composition
- RoHS restricted substances in materials
- Contaminants in food, water, and soil
- Alloy verification and positive material identification
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DIN EN ISO 11885
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BS EN ISO 11885
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NF EN ISO 11885
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UNI EN ISO 11885
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UNE EN ISO 11885
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NEN EN ISO 11885
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DIN EN ISO 17294-2
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BS EN ISO 17294-2
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NF EN ISO 17294-2
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UNI EN ISO 17294-2
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UNE EN ISO 17294-2
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NEN EN ISO 17294-2
3,024
Accredited labs
24
Countries
Showing 1–6 of 6 labs
ISO 4831
ISO 4832
ISO 4833-1
ISO 6579-1
ISO 6888-1
+ 3 more
Hohenstein Laboratories (HK)
Active
DIN EN ISO 105-A01
DIN EN 20105-A02
DIN EN ISO 105-A03
DIN EN ISO 105-B02
DIN EN ISO 105-B07
+ 3 more
DIN EN ISO 20344
ISO 22568-1: 2019 Clause 5.2.1
ISO 22568-2: 2019 Clause 5.2.1
(withdrawn)EN ISO 20344:2011
DIN EN ISO 22568-1
+ 3 more
ISO 8124-6
BS EN ISO 14362-1
ISO 17234-2
ISO 17353
ISO 16181-1
+ 3 more
ASTM E1645-20a
ISO 14389
DIN EN ISO 14362-1
EN 14372
BS ISO 17353
+ 3 more
TÜV Rheinland Hong Kong
Active
DIN EN ISO 7971-3
DIN EN 16711-2
CD71
DIN EN ISO 717-1
DIN EN 1122
+ 3 more
No matching labs found.